DUTs

A device under test (DUT) is any physical device, circuit, assembly, or software subsystem that is subjected to evaluation to determine whether it meets predefined requirements. DUTs are used across electronics manufacturing, telecommunications, automotive, and consumer electronics to verify function, performance, interoperability, safety, and reliability.

In a test setup, the DUT is connected to a test fixture or load board that provides electrical interfaces, power, signal stimuli, and measurement probes. Test equipment such as oscilloscopes, spectrum analyzers, multimeters, logic analyzers, and signal generators create stimuli and collect data. The fixture and instrumentation are designed to ensure consistent connections and controlled environmental conditions when required.

Testing objectives typically include functional verification (does the device perform its intended tasks), timing and performance (throughput, latency, response times), electrical characteristics (voltage levels, noise, impedance), and safety and reliability under stress or extended operation. Compliance with industry standards may also be assessed.

The testing process usually involves selecting a DUT, designing test cases and stimuli, executing tests, recording measurements, and analyzing results. Failures are tracked for fault isolation, debugging, and design iteration. Documentation often includes the DUT identifier, hardware revision, serial number, test plan, and results.

Other terms with similar meaning include Unit Under Test (UUT) and System Under Test (SUT). In practice, DUT is widely used in hardware engineering, IC testing, and board-level verification to describe the item being evaluated.