SAEDmittaukset
SAEDmittaukset, also known as Selective Area Electron Diffraction (SAED), is a technique used in transmission electron microscopy (TEM) to analyze the crystalline structure of materials at a microscale level. It involves directing a focused electron beam through a small, selected region of a specimen to produce a diffraction pattern that reveals information about the material’s crystal symmetry, lattice parameters, and defects.
The process begins with the preparation of a thin specimen, typically less than 100 nanometers in thickness,
SAED is particularly useful for identifying phases in multiphase materials, detecting crystallographic orientations, and studying nano-sized
Compared to other diffraction methods, SAED allows for localized analysis within a tiny region, offering high
Overall, SAEDmittaukset serve as a crucial tool in material characterization, enabling scientists to understand the underlying