Oberflächenmikroverfahren
Oberflächenmikroskopie, or surface microscopy, is a field of microscopy dedicated to imaging and characterizing surfaces at micro- to nanometer-scale resolution. It covers a range of techniques designed to reveal topography, roughness, structure, and sometimes mechanical or chemical properties of material surfaces. The aim is to understand surface phenomena that influence adhesion, wear, catalysis, and electronic behavior.
Principal techniques include scanning probe microscopy (SPM), such as atomic force microscopy (AFM) and scanning tunneling
AFM uses a sharp tip mounted on a flexible cantilever that deflects in response to surface forces,
SEM scans a focused electron beam across the surface, producing secondary or backscattered electrons to form
NSOM solves the diffraction limit by using a sub-wavelength optical probe to map optical and near-field properties;
Applications span materials science, semiconductors, nanotechnology, biology (cell-surface interfaces), tribology, and corrosion studies, as well as
---