probeinduced
Probeinduced is a term used to describe effects that arise from the measurement probe itself interacting with the system under study. In scientific reporting, it denotes a class of measurement artifacts or perturbations caused by the presence, operation, or proximity of the probe, rather than intrinsic properties of the sample.
Contexts in which probeinduced effects are discussed include scanning probe microscopy (such as atomic force microscopy
Common mechanisms include physical contact or force application, electromagnetic coupling, local heating, chemical interactions at the
Mitigation strategies emphasize minimizing coupling between probe and sample, using non-invasive or low-impact techniques, calibrating with
Etymology stems from “probe” (the measuring instrument) and “induced” (caused by that instrument). See also measurement