Yksittäisvirhe
Yksittäisvirhe, known in English as single-event effect (SEE), is a phenomenon occurring in electronic components, particularly in semiconductor devices, when a single ionizing particle interacts with the material. This interaction can cause a localized disturbance in the electrical state of the device. The ionizing particles responsible are often from cosmic rays or radioactive decay, but can also originate from alpha particles emitted by packaging materials.
The consequences of a yksittäisvirhe can vary significantly. It can lead to a transient error, often referred
The susceptibility of electronic components to yksittäisvirhe is influenced by several factors, including the type of