Yksittäisvirhe

Yksittäisvirhe, known in English as single-event effect (SEE), is a phenomenon occurring in electronic components, particularly in semiconductor devices, when a single ionizing particle interacts with the material. This interaction can cause a localized disturbance in the electrical state of the device. The ionizing particles responsible are often from cosmic rays or radioactive decay, but can also originate from alpha particles emitted by packaging materials.

The consequences of a yksittäisvirhe can vary significantly. It can lead to a transient error, often referred to as a soft error, where the device temporarily malfunctions but returns to its normal operation after the disturbance passes. This might manifest as a bit flip in memory, where a 0 changes to a 1 or vice versa. In more severe cases, a single particle strike can cause a permanent damage to the device, known as a hard error. This can result in latch-up, where the device gets stuck in a high-current state requiring a power cycle to reset, or even burnout of the component.

The susceptibility of electronic components to yksittäisvirhe is influenced by several factors, including the type of semiconductor technology used, the size and density of transistors, the operating voltage, and the shielding provided. For applications where reliability is critical, such as in aerospace, medical devices, and automotive systems, mitigation techniques are employed. These can include using radiation-hardened components, implementing error detection and correction codes, and redundant system designs. Understanding and mitigating yksittäisvirhe is essential for ensuring the dependable operation of modern electronics in various environments.