TEMmodus

TEMmodus is a term used to describe a mode in transmission electron microscopy that is designed to optimize imaging workflows by enabling rapid switching among common imaging and analysis configurations within a single instrument session. The concept combines the abbreviation TEM (transmission electron microscopy) with the word modus (mode) to indicate a structured set of operating conditions intended to streamline data collection and analysis.

In practice, TEMmodus refers to a configurable framework in which preset parameters control elements such as condenser and objective lenses, stigmation, energy filtering, and detector selection. It commonly supports quick transitions between imaging modes—such as bright-field, dark-field, and diffraction in conventional TEM, or high-angle annular dark-field imaging and diffraction patterns in scanning TEM (STEM)—as well as automatic optimization routines for alignment and aberration correction. Some implementations also integrate preset workflows for in situ experiments, spectroscopy, and diffraction analysis, allowing researchers to document and reproduce imaging conditions.

The rationale behind TEMmodus is to reduce setup time, minimize operator-induced variability, and improve reproducibility of experiments that require multiple contrast mechanisms or analytical modalities. It is especially relevant in materials science, nanotechnology, and biology where combined imaging and diffraction data are routinely collected. While the exact feature set and naming can vary by instrument manufacturer, TEMmodus generally emphasizes modularity, automation, and traceability of imaging conditions.

Critically, TEMmodus remains a concept rather than a universal standard; different microscope platforms may implement similar capabilities under different names or with varying levels of automation. See also: transmission electron microscopy, scanning TEM, electron diffraction, energy-filtered TEM.