Mikroszkennelés

Mikroszkennelés is a term used in Hungarian to describe the set of techniques that acquire spatially resolved information from microscopic structures by scanning the sample with a probing instrument. The goal is to produce high-resolution images and measurements of morphology, topography, composition, or internal structure, often at micron or nanometer scales. The concept encompasses several imaging modalities and measurement methods that operate at micro-scale resolutions.

Common modalities within mikroszkennelés include optical scanning microscopy (such as laser scanning confocal microscopy and structured illumination), optical profilometry (for surface topography), scanning electron microscopy (SEM) for high-resolution imaging and compositional analysis, and scanning probe techniques (including atomic force microscopy and scanning tunneling microscopy) for surface physics at the nanometer scale. Micro-computed tomography (micro-CT) is also used to obtain three-dimensional representations of internal microstructures without extensive sectioning.

Applications of mikroskennelés span many fields, notably materials science, biology, electronics, geology, and cultural heritage. It enables researchers to characterize microstructural features, quantify surface roughness, map elemental distribution, and visualize internal architectures in three dimensions.

Workflow and data handling typically involve specimen preparation appropriate to the chosen technique, selection of scanning parameters (resolution, speed, dwell time), data acquisition, and subsequent image reconstruction or data processing. Analysts use software to measure features, perform qualitative assessments, and extract quantitative descriptors. Limitations include potential sample preparation artifacts, radiation damage for certain modalities, long acquisition times, and high equipment costs. The term reflects a Hungarian emphasis on micro-scale scanning across multiple technical approaches.