EBSDi
EBSDi, short for Electron Backscatter Diffraction Imaging, is an advanced analytical technique used in materials science to characterize the microstructure of crystalline materials. It utilizes electron backscatter patterns generated when a focused electron beam interacts with a sample’s surface within a scanning electron microscope (SEM). By analyzing these patterns, EBSDi allows researchers to determine the crystallographic orientation, phase distribution, grain boundaries, and deformation mechanisms at high spatial resolution.
The primary goal of EBSDi is to provide detailed insights into the structural features of materials, such
Compared to traditional EBSD, EBSDi often incorporates enhanced imaging technological advancements, such as higher resolution detectors
EBSDi is valued for its non-destructive nature, high spatial resolution (often sub-micron), and capability to analyze
Overall, EBSDi has become an essential technique in understanding the relationship between microstructure and material properties,