3Dprofilometrialla
3Dprofilometrialla refers to a set of optical metrology techniques used to capture the three-dimensional topography of a surface with high vertical resolution. The result is a quantitative 3D height map of the surface and derived texture information, enabling analysis of roughness, waviness, form errors, and surface defects.
Common approaches include interferometric profilometry (white-light or phase-shifting interferometry), confocal laser scanning profilometry, structured-light or projection-based
Output data typically consist of a height map or point cloud, with optional cross-sections and color-coded topography.
Applications span metrology laboratories and quality control in semiconductor manufacturing, optics, automotive and aerospace components, medical
Advantages include non-contact measurement, high vertical and lateral resolution, and rapid data acquisition. Limitations involve sensitivity
Standards and practices in the field are guided by areal surface texture standards, notably the ISO 25178