uitleesruis

Uitleesruis, often translated as readout noise, is a term used in electronics and imaging to describe the random fluctuations that are added to a detector signal during the readout stage. It arises in the readout circuitry and in the process of converting collected charge into a voltage and amplifying it for digitization. The main components typically include reset noise from the charge‑to‑voltage conversion and the intrinsic noise of the readout amplifier. Together these sources determine how precisely a weak signal can be measured after it leaves the detector.

The magnitude of uitleesruis is usually expressed as an RMS value, commonly given in electrons or in digital units, and it depends on factors such as readout speed, temperature, sensor architecture, and the design of the readout chain. It is a key factor in the overall noise budget of a detector, especially in low-light or low-signal situations where other noise sources like dark current can be suppressed or become negligible in comparison.

Context and applications: Uitleesruis is a central consideration in imaging technologies such as charge-coupled devices (CCDs) and CMOS sensors used in astronomy, scientific instrumentation, and medical imaging. Reducing readout noise improves the achievable signal-to-noise ratio and enables the detection of faint signals.

Reduction techniques include correlated double sampling and other readout schemes that cancel reset noise, the use of low-noise front-end amplifiers, slower readout speeds, and cooling to reduce thermal noise. Calibration and digital post-processing can also help mitigate its impact. In Dutch technical literature, uitleesruis is the term commonly used to describe this phenomenon.