tckgens
Tckgens are clock generation components or modules that produce the JTAG Test Clock, TCK, which is used to drive boundary-scan operations and JTAG-based debugging. The TCK signal coordinates the shifting of data on TDI and TDO while TMS controls the TAP controller state transitions.
Implementations of tckgens vary. Hardware-based tckgens include dedicated clock generators and programmable oscillators, as well as
Key considerations for tckgens include achieving the desired clock frequency within device specifications, maintaining an appropriate
Applications of tckgens span boundary-scan testing, in-system programming of devices (including FPGA configurables), and debugging of
See also: JTAG, boundary scan, IEEE 1149.1, TMS, TDI, TDO, TAP controller.