Röntgendifraktsio

Röntgendifraktsio is the Finnish term for X-ray diffraction. This is a powerful analytical technique used to determine the atomic and molecular structure of a crystal. When X-rays are directed at a crystalline sample, they are scattered in a specific pattern due to the regular arrangement of atoms within the crystal lattice. This scattering pattern, known as a diffraction pattern, is unique to the crystal's structure.

By analyzing the angles and intensities of the diffracted X-rays, scientists can deduce the positions of atoms within the crystal. This information is crucial in various scientific fields, including materials science, chemistry, physics, and biology. For instance, X-ray diffraction is used to identify unknown crystalline substances, determine the purity of materials, and study the properties of new compounds. In solid-state physics, it helps understand the electronic and magnetic properties of materials. In chemistry, it can confirm the structure of synthesized molecules.

The process typically involves an X-ray source, a sample holder, and an X-ray detector. The X-rays interact with the electrons in the atoms of the sample, causing them to scatter. Constructive interference occurs when the scattered waves are in phase, leading to the observed diffraction peaks. The resulting diffraction pattern is then processed using mathematical methods, such as Fourier transforms, to reconstruct the electron density map of the crystal, revealing its atomic arrangement.