substraalille
Substraalille is a term encountered in a limited set of Dutch-language sources describing a thin interfacial layer within a substrate, typically in materials science and related fields. The term is not widely standardized, and its precise definition can vary between authors.
In general, substraalille is proposed to be a nanoscale layer that lies at or near the interface
Characterization and study of substraalille commonly employ microscopy and spectrometry techniques such as SEM, TEM, AFM,
Because the term is not widely standardized, researchers often define substraalille within the context of a
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