Substraalille

Substraalille is a term encountered in a limited set of Dutch-language sources describing a thin interfacial layer within a substrate, typically in materials science and related fields. The term is not widely standardized, and its precise definition can vary between authors.

In general, substraalille is proposed to be a nanoscale layer that lies at or near the interface between a substrate and an overlayer or coating. It may form during deposition, annealing, or chemical modification and can influence adhesion, diffusion, mechanical properties, and stress distribution. Reported compositions range from metal- and ceramic-based interlayers to organic or composite mixtures, depending on the system studied.

Characterization and study of substraalille commonly employ microscopy and spectrometry techniques such as SEM, TEM, AFM, XPS, and SIMS, sometimes complemented by nanoindentation or Raman spectroscopy to probe mechanical and chemical properties.

Because the term is not widely standardized, researchers often define substraalille within the context of a particular project or material system. The concept is closely related to interlayers, diffusion barriers, and substrate aging but is not universally recognized as a distinct category.

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