ionoscopy

Ionoscopy is a term used to describe imaging techniques that rely on ions to visualize internal structures or processes. It is not a single standardized method, but a broad label for methods that employ ion beams, ion-induced emissions, or ion‑driven contrast mechanisms to produce images or chemical maps.

In materials science, ionoscopy often refers to imaging systems that use focused ion beams—such as helium ion microscopes or gallium-focused ion beam instruments—to obtain high-resolution surface images or to mill and image sequential layers.

In analytical chemistry and surface analysis, ionoscopy can denote imaging via secondary ion mass spectrometry (SIMS), where a primary ion beam sputters the surface and the emitted secondary ions are mass analyzed to map elemental or molecular distributions.

In medical contexts, some uses involve ionizing radiation (protons, carbon ions, or other heavy ions) to obtain radiographic or tomographic images for planning or research, as well as image-guided therapy.

Advantages include high spatial resolution and surface sensitivity for certain methods; limitations include damage to samples, restricted penetration depth for ions, vacuum requirements for many setups, and the need for specialized equipment and shielding for ionizing modalities.

Related techniques include ion beam imaging, secondary ion mass spectrometry imaging, and helium ion microscopy.