Xstrålekrystallografi

Xstrålekrystallografi, often called X-ray crystallography, is a scientific technique used to determine the atomic and molecular structure of a crystal. In this method, a beam of X-rays is directed at a crystalline sample. The X-rays interact with the electrons in the atoms of the crystal, causing them to scatter. Because the atoms in a crystal are arranged in a highly ordered, repeating lattice, the scattered X-rays interfere with each other constructively and destructively. This interference pattern, known as a diffraction pattern, is captured on a detector.

The recorded diffraction pattern is a complex series of spots. Analyzing the positions and intensities of these spots allows scientists to mathematically reconstruct the electron density distribution within the crystal. From this electron density map, the precise locations of individual atoms can be determined, revealing the molecule's three-dimensional structure. This technique is fundamental in fields such as chemistry, physics, biology, and materials science for understanding the arrangement of atoms in solids. It has been crucial for determining the structures of proteins, DNA, viruses, and various inorganic and organic compounds. The resolution of the structure obtained depends on the quality of the crystal and the quality of the diffraction data.