Mikroanalüüsisüsteem

Mikroanalüüsisüsteem, often referred to as a microanalysis system, is a broad term encompassing a range of analytical techniques and instruments designed to determine the elemental or chemical composition of extremely small samples or specific regions within a larger sample. These systems are crucial in fields where sample material is limited or where detailed spatial information about composition is required.

The core principle behind most mikroanalüüsisüsteem is the interaction of a probe with the sample material, leading to a detectable response that is characteristic of the elements present. Common probe types include electron beams, X-rays, or ions. The resulting signals can vary, such as emitted X-rays, secondary electrons, or characteristic light. By analyzing these signals, researchers can identify the elements present and often their relative concentrations.

Key technologies that fall under the umbrella of mikroanalüüsisüsteem include Energy Dispersive X-ray Spectroscopy (EDS or EDX), Wavelength Dispersive X-ray Spectroscopy (WDS), Electron Probe Microanalysis (EPMA), and Secondary Ion Mass Spectrometry (SIMS). These techniques are often integrated into larger instruments like Scanning Electron Microscopes (SEM) and Transmission Electron Microscopes (TEM) to provide both high-resolution imaging and elemental analysis.

Applications of mikroanalüüsisüsteem are diverse, spanning materials science, geology, biology, and forensics. For example, they are used to identify contaminants in microelectronic components, analyze the mineral composition of rocks, study the distribution of elements in biological tissues, or determine the elemental makeup of gunshot residue. The ability to perform analysis at the micrometer or even nanometer scale makes these systems indispensable for detailed scientific investigation.