Elementaranalysen

Elementaranalysen refer to analytical procedures that determine the elemental composition of a material. They quantify what elements are present and in what proportions, and can be applied to organic compounds, minerals, metals, ceramics, and composites. Analyses may target bulk composition or selective layers near surfaces, depending on technique and goal.

A wide range of methods is used. CHN/CHNS analyzers determine carbon, hydrogen, nitrogen and sometimes sulfur and oxygen in organic substances. X-ray fluorescence (XRF) provides rapid bulk elemental surveys for many elements. Inductively coupled plasma methods (ICP-OES, ICP-MS) enable multi-element quantification with low detection limits, including trace elements. Atomic absorption/vapor techniques (AAS, ICP-AES) are common for specific elements. For detailed surface information, X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS) analyze the outermost layers.

Results are presented as weight or atomic percent, sometimes as concentrations in solution. Data interpretation requires calibration with standards and consideration of matrix effects, detection limits, and potential interferences. Some analyses are destructive (e.g., CHN, ICP-MS) while XRF and XPS can be non-destructive or minimally destructive. Analysts report uncertainties and quality flags, and measurements are validated against certified reference materials.

Elementaranalysen underpin quality control in pharmaceuticals and materials science, environmental monitoring, food authenticity, and archaeological research, among others. They aid material identification, purity assessment, and regulatory compliance.