Currentinplane

Current-in-plane (CIP) refers to a specific configuration in which an electric current flows parallel to the plane of a material or device, typically used in the study of electrical, magnetic, and transport properties in thin films, layered structures, or two-dimensional materials. This geometry is commonly employed in experiments involving superconductors, magnetic multilayers, and graphene-based systems to investigate phenomena such as resistance, magnetoresistance, and spin transport.

In CIP measurements, electrodes are often deposited on the edges or surfaces of the sample, ensuring that the current flows laterally rather than perpendicularly through the material. This configuration is particularly useful for probing in-plane anisotropy, where material properties vary depending on the direction of current flow. For example, in anisotropic superconductors, CIP transport can reveal differences in critical current density or resistance between crystallographic axes.

CIP setups are frequently used in conjunction with other techniques, such as Hall effect measurements or magnetotransport experiments, to extract detailed information about charge carrier behavior. The method is also applicable in spintronics research, where spin-polarized currents are injected and detected in-plane to study spin diffusion, spin-orbit coupling, and spin precession effects.

Compared to current-perpendicular-to-plane (CPP) configurations, CIP measurements are generally simpler to implement but may require careful consideration of contact resistance and edge effects. The choice between CIP and CPP depends on the material properties being investigated and the specific scientific questions being addressed.