stylusprofilometrit

Stylus profilometry is a non-destructive metrology technique used to measure the surface topography of a material. It relies on a physical stylus, typically a diamond or sapphire tip, that is dragged across the surface of the sample. The stylus is attached to a transducer, which converts the vertical movements of the stylus as it encounters surface features into an electrical signal. This signal is then amplified and recorded by a computer, creating a 2D profile of the surface.

The stylus tip is very fine, often with a radius of only a few micrometers, allowing for the measurement of fine surface details. The stylus force is carefully controlled to avoid damaging the sample surface. As the stylus traverses the surface, the transducer detects changes in its position, and these changes are translated into a graphical representation of the surface height variations.

Stylus profilometry is widely used in various industries, including semiconductor manufacturing, optics, automotive, and aerospace, for quality control and research. It is effective for measuring parameters such as surface roughness, waviness, step heights, and feature dimensions. The technique offers good lateral resolution and can measure a wide range of surface heights, from nanometers to millimeters. However, it can be slow for large areas and the stylus can potentially scratch very soft or delicate surfaces. The choice of stylus tip material and shape is crucial for accurate measurements and to prevent surface damage.