röntgensäteilyanalyysin

Röntgensäteilyanalyysi, also known as X-ray analysis, is a broad term encompassing various techniques that utilize X-rays to study the structure and composition of materials. These methods exploit the interaction of X-rays with matter, which can range from absorption and scattering to the emission of secondary X-rays.

One of the most common applications is X-ray diffraction (XRD). In XRD, a beam of X-rays is directed at a crystalline sample, and the angles at which the X-rays are diffracted are measured. These diffraction patterns are unique to the crystal structure of the material, allowing for identification of crystalline phases and determination of lattice parameters.

Another significant technique is X-ray fluorescence (XRF). XRF involves bombarding a sample with primary X-rays, which in turn causes the sample to emit secondary X-rays at characteristic energies. The energies and intensities of these emitted X-rays reveal the elemental composition of the sample, making XRF a powerful tool for qualitative and quantitative elemental analysis without the need for sample preparation in many cases.

Other X-ray analysis methods include X-ray absorption spectroscopy (XAS), which provides information about the electronic and local atomic environment of specific elements, and X-ray microscopy, which uses X-rays to create magnified images of samples, often with higher resolution than light microscopy for certain materials. These techniques are widely employed in fields such as materials science, chemistry, geology, biology, and industry for characterization, quality control, and research purposes.