epilayer
An epilayer, short for epitaxial layer, is a crystalline layer grown on a crystalline substrate in which the layer adopts the same or a defined crystallographic orientation as the substrate. Epitaxial growth is used to produce high-quality single-crystal films with controlled composition and thickness. It is classified as homoepitaxy when the epilayer and substrate are the same material, and heteroepitaxy when they differ.
Common growth methods include molecular beam epitaxy (MBE), metalorganic chemical vapor deposition (MOCVD, also called MOVPE),
Silicon, GaAs, GaN, InP, and SiC are frequently grown epitaxially on Si, GaAs, sapphire, or SiC substrates.
Quality of the epilayer, including surface morphology and defect density (e.g., threading dislocations), strongly influences device
Characterization techniques include X-ray diffraction, RHEED, TEM, and atomic force microscopy. In situ monitoring and ex