Xcoat

Xcoat is a software application developed by Xcoat Software, designed for the analysis of thin film systems using X-ray reflectometry (XRR) and grazing incidence X-ray diffraction (GIXD). The software is widely used in the fields of materials science, physics, and engineering for the characterization of thin films and multilayer structures.

Xcoat provides a user-friendly interface that allows researchers to simulate and analyze X-ray scattering data from thin film systems. It supports a variety of models for thin film structures, including homogeneous and graded layers, and can handle complex multilayer systems with multiple interfaces. The software includes features for fitting experimental data to theoretical models, enabling the determination of layer thicknesses, densities, and roughness parameters.

One of the key features of Xcoat is its ability to simulate X-ray reflectivity curves, which are essential for understanding the structural properties of thin films. The software also supports the analysis of GIXD data, providing insights into the crystalline structure and orientation of thin films. Xcoat is compatible with various X-ray sources and detectors, making it a versatile tool for researchers working with different experimental setups.

Xcoat is available for Windows and Linux operating systems and can be used for both academic and industrial research. The software is regularly updated to include new features and improvements, ensuring that users have access to the latest tools for thin film analysis. Xcoat's comprehensive capabilities and user-friendly interface make it a valuable resource for researchers studying the properties and behavior of thin film materials.