WarrenAverbachAnalysen

WarrenAverbachAnalysen, also known as the Warren–Averbach analysis, is a technique in materials characterization used to interpret the broadening of X-ray diffraction peaks in order to quantify crystallite size and lattice strain.

The method was developed in the mid-20th century by researchers referred to as Warren and Averbach. It relies on Fourier analysis of line profiles: by examining diffraction peaks across multiple orders, it seeks to separate the contributions to broadening that arise from finite crystallite size and from microstrain within the crystal lattice.

Practically, the approach computes the Fourier transform of each diffraction peak and analyzes how the transform decays with respect to Fourier length. By comparing the behavior for different reflections, the method provides estimates of crystallite size distributions and the extent of lattice distortion. Outputs commonly include average crystallite size, size distribution characteristics, and measures related to microstrain or dislocation density.

Applications of Warren–Averbach analysis are widespread in metals, ceramics, and other crystalline materials, including nanocrystalline and thin-film systems. It is used to assess effects of heat treatment, mechanical deformation, and processing on the internal structure, helping to link microstructure with material properties.

Limitations of the technique include sensitivity to instrumental broadening and peak overlap, the need for accurate subtraction of instrumental effects, and underlying assumptions such as isotropy and random grain orientation. The method is often employed in combination with complementary analyses, such as Williamson–Hall plots, to improve robustness and interpretation.