WarrenAverbachAnalysen
WarrenAverbachAnalysen, also known as the Warren–Averbach analysis, is a technique in materials characterization used to interpret the broadening of X-ray diffraction peaks in order to quantify crystallite size and lattice strain.
The method was developed in the mid-20th century by researchers referred to as Warren and Averbach. It
Practically, the approach computes the Fourier transform of each diffraction peak and analyzes how the transform
Applications of Warren–Averbach analysis are widespread in metals, ceramics, and other crystalline materials, including nanocrystalline and
Limitations of the technique include sensitivity to instrumental broadening and peak overlap, the need for accurate