Röntgenspektroskoopiat

Röntgenspektroskopie, also known as X-ray spectroscopy, is a family of techniques used to characterize the elemental composition and chemical state of a material by analyzing its interaction with X-rays. When X-rays strike a sample, they can be absorbed, scattered, or cause the emission of secondary X-rays. These emitted X-rays, often called fluorescent X-rays, have energies that are characteristic of the elements present in the sample. By measuring the energy and intensity of these fluorescent X-rays, one can determine which elements are in the sample and in what quantities. Different types of X-ray spectroscopy exist, each with its own advantages and applications. For instance, X-ray fluorescence (XRF) spectroscopy is widely used for elemental analysis of solids, liquids, and powders. X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), provides information about the electronic structure of atoms, revealing their chemical state and bonding. This technique is surface-sensitive. Other methods include X-ray absorption spectroscopy (XAS), which probes the electronic transitions and local atomic environment, and X-ray emission spectroscopy (XES), which analyzes emitted X-rays to identify elements and their oxidation states. Röntgenspektroskopie finds applications in a vast array of fields, including materials science, chemistry, geology, environmental monitoring, archaeology, and forensics, due to its ability to provide detailed chemical and elemental information, often non-destructively.