Röntgenemissionsspektroskopie

Röntgenemissionsspektroskopie, often abbreviated as XES, is an analytical technique used to study the elemental composition and electronic structure of materials. It is based on the principle of observing the characteristic X-ray photons emitted by a sample when it is excited by an incident X-ray beam. When a high-energy X-ray photon strikes an atom in the sample, it can eject an inner-shell electron, creating a vacancy. This vacancy is then filled by an electron from a higher energy shell. As the electron transitions to the lower energy level, it releases its excess energy in the form of an emitted X-ray photon. The energy of this emitted photon is characteristic of the specific element and the electronic transition that occurred within the atom. By measuring the energies and intensities of these emitted X-ray photons, scientists can identify the elements present in the sample and gain insights into their chemical states and bonding. XES is a non-destructive technique and can be applied to a wide range of solid, liquid, and gaseous samples. It is particularly useful for analyzing light elements, which are difficult to detect with other X-ray techniques. Applications of XES span various fields, including materials science, chemistry, environmental science, and solid-state physics, aiding in tasks such as determining oxidation states, identifying impurities, and understanding surface chemistry.