Dünnschichtanalytik

Dünnschichtanalytik refers to a group of analytical techniques used to identify and quantify substances present in very thin layers or films. These layers can be naturally occurring, such as those found on surfaces, or intentionally applied, like in chromatography or thin-film deposition. The primary challenge in dünnschichtanalytik is the small sample size, requiring highly sensitive methods.

Commonly employed techniques include spectroscopy, such as X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES), which probe the elemental composition and chemical states of the surface. Mass spectrometry, particularly secondary ion mass spectrometry (SIMS), is also valuable for determining the elemental and molecular composition of thin films. Microscopy techniques, like atomic force microscopy (AFM) and scanning electron microscopy (SEM), provide morphological and topographical information. Chromatography, especially thin-layer chromatography (TLC) and high-performance thin-layer chromatography (HPTLC), is used for separating and identifying components within a thin layer, often on a plate.

The applications of dünnschichtanalytik are diverse, spanning materials science, environmental monitoring, food analysis, and pharmaceutical quality control. It is crucial for characterizing coatings, studying corrosion processes, analyzing semiconductor materials, and detecting trace contaminants. The development of increasingly sophisticated and sensitive instrumentation continues to expand the capabilities and applications of this analytical field.