Braggpeaks

Braggpeaks are a term used in diffraction analysis to describe sharp diffraction maxima that arise when scattered waves satisfy conditions for constructive interference with crystallographic planes in a material. The concept echoes the fundamental Bragg condition and is employed as a convenient label for peaks that are particularly well-defined in a pattern, signaling crystalline order.

Origin and interpretation. Braggpeaks occur at discrete angles determined by the lattice spacing and the incident wavelength, following 2d sin θ = nλ. Each peak can be indexed by Miller indices (hkl), linking its position to specific sets of lattice planes. The number, positions, and intensities of Braggpeaks convey information about crystal structure, phase composition, and lattice parameters. Narrow, intense peaks indicate high crystallinity and low microstrain, while broadened or split peaks point to small crystallites, strain, or multiple phases.

Measurement and analysis. The most common techniques producing Braggpeaks are X-ray diffraction (XRD), neutron diffraction, and electron diffraction. Data are analyzed through peak fitting, indexing, and refinement methods such as Rietveld analysis to extract lattice parameters, phase fractions, and crystallite sizes. Peak positions provide parameter values, while relative intensities reflect structure factors and texture.

Applications and limitations. Braggpeaks are central to phase identification, quality control, and materials characterization in fields ranging from geology to metallurgy and pharmaceuticals. Limitations include peak overlap in complex mixtures, preferred orientation effects, and the need for well-calibrated instrumentation. See also Bragg’s law and related diffraction concepts.