130nm
130nm refers to a semiconductor manufacturing process node. This metric, measured in nanometers, signifies the approximate size of the smallest features that can be reliably patterned onto a silicon wafer during integrated circuit fabrication. The 130nm process was a significant advancement in microelectronics, representing a leap forward in transistor density and performance compared to earlier generations.
Developed in the early 2000s, the 130nm technology enabled the creation of more complex and powerful microprocessors,
While no longer at the cutting edge of semiconductor manufacturing, which has progressed to nodes like 7nm