stylusprofilometrialla

Stylus profilometry is a non-destructive surface characterization technique used to measure the surface topography and roughness of a sample. It involves a sharp stylus, typically made of diamond, that is drawn across the surface of the material. As the stylus moves, it encounters variations in the surface height, causing the stylus to move up and down. This vertical movement is detected by a sensor, which translates it into an electrical signal. This signal is then processed by a computer to create a digital representation of the surface profile, often displayed as a 2D graph of height versus lateral position.

The stylus tip radius is a critical parameter, with smaller tips allowing for the measurement of finer surface features. The stylus force, or the pressure applied to the surface, is also controlled to prevent damage to delicate samples. Stylus profilometry is widely used in various industries, including manufacturing, semiconductor fabrication, and research, for quality control, material characterization, and process development. It is particularly useful for measuring parameters such as average roughness (Ra), root mean square roughness (Rq), and peak-to-valley height. The technique offers a good balance of resolution, speed, and cost-effectiveness for many surface measurement applications.