röntgenkidefraaktion

Röntgenkidefraktion, often abbreviated as XRD, is an analytical technique used for determining the crystallographic structure of a sample. It is based on the principle of X-ray diffraction, where X-rays interact with the ordered arrangement of atoms in a crystalline material. When a beam of X-rays strikes a crystal, the waves are scattered in specific directions due to constructive interference from the regularly spaced atoms. This scattering produces a unique diffraction pattern.

The X-rays are generated by an X-ray tube and then directed onto a sample, typically a powder or a single crystal. The diffracted X-rays are detected and recorded, usually as a plot of intensity versus diffraction angle. This resulting pattern, known as a diffractogram, contains information about the spacing between atomic planes within the crystal lattice. By analyzing the positions and intensities of the diffraction peaks, scientists can identify the crystalline phases present in the sample, determine their unit cell dimensions, and in some cases, even ascertain the precise arrangement of atoms.

XRD is a versatile and non-destructive technique widely employed in various fields, including materials science, chemistry, geology, and pharmaceuticals. It is used for material identification, phase analysis, quantitative determination of crystalline components, and study of crystal defects and preferred orientation. The technique requires relatively small sample sizes and can provide rapid results, making it an invaluable tool for research and quality control.