röntgendifraktometriával

röntgendifrakt, also known as an X‑ray diffractometer, is an analytical instrument used to study the crystallographic structure of materials. It operates on the principle of Bragg’s law, where incoming X‑ray photons are diffracted by the lattice planes of a crystalline sample. The constructive interference of the diffracted waves produces a pattern that is recorded as a series of peaks. By measuring the angles and intensities of these peaks, scientists can deduce lattice spacings, identify crystalline phases, and determine the orientation of crystals.

An X‑ray diffractometer typically consists of an X‑ray generator, a monochromator or wavelength‑stable source, a goniometer to precisely orient the sample, and a detector such as a scintillation counter, charge‑coupled device, or a position‑sensitive detector. Modern systems may include rotating anode sources or synchrotron radiation for high flux, enabling rapid data acquisition and high resolution.

X‑ray diffraction is widely applied in materials science, mineralogy, geology, chemistry, and physics. Its uses range from determining unknown crystal structures, monitoring phase transitions, investigating stress and strain in solids, to quality control in semiconductor and polymer manufacturing. The technique also underpins powder diffraction methods, where polycrystalline samples produce characteristic patterns that can be compared to reference databases for phase identification.