mikrosondenanalytische

Mikrosondenanalytik refers to a group of analytical techniques used to determine the elemental composition of very small sample volumes, often at the micrometer or even nanometer scale. The core principle involves directing a focused beam of particles, such as ions or electrons, onto a sample surface. The interaction of this beam with the sample generates characteristic signals that are then detected and analyzed to identify and quantify the elements present.

Common techniques within mikrosondenanalytik include Electron Probe Microanalysis (EPMA) and Secondary Ion Mass Spectrometry (SIMS). EPMA utilizes an electron beam to excite atoms in the sample, causing them to emit X-rays. The energy and intensity of these X-rays are unique to each element, allowing for both qualitative and quantitative analysis. SIMS, on the other hand, bombards the sample with a primary ion beam, sputtering off secondary ions from the surface. These secondary ions are then mass-analyzed, providing high sensitivity and isotopic information.

The applications of mikrosondenanalytik are diverse and span various scientific fields. It is crucial in materials science for characterizing the composition of alloys, ceramics, and composite materials, identifying defects, and studying diffusion processes. In geology, it helps in analyzing mineral compositions, fluid inclusions, and dating geological samples. Furthermore, it finds use in semiconductor industry for quality control and failure analysis, as well as in forensic science and environmental studies for trace element analysis. The ability to analyze microscopic regions makes mikrosondenanalytik indispensable for understanding complex sample structures at a detailed level.