mikrosondenanalytik
Mikrosondenanalytik, also known as microprobe analysis, is a scientific technique used to determine the elemental and isotopic composition of microscopic samples. It involves the use of a focused beam of particles, typically ions or electrons, to interact with the sample. This interaction causes the emission of secondary particles or radiation from the sample, which are then detected and analyzed. The spatial resolution of microprobe analysis is very high, allowing for the characterization of features down to the micrometer or even nanometer scale.
Common types of microprobe analysis include Electron Probe Microanalysis (EPMA) and Secondary Ion Mass Spectrometry (SIMS).
Mikrosondenanalytik finds applications in a wide range of fields, including geology, materials science, and biology. In