kiirgusvastupidavus

Kiirgusvastupidavus, also known as radiation hardening, refers to the ability of electronic components or systems to withstand damage or malfunction caused by exposure to ionizing radiation. This is a critical consideration in environments where radiation levels are high, such as outer space, nuclear power plants, or medical radiation therapy facilities.

Ionizing radiation, including alpha particles, beta particles, gamma rays, and neutrons, can interact with semiconductor materials in electronic devices. These interactions can lead to various effects, such as charge trapping, lattice defects, and single-event upsets (SEUs). Charge trapping can alter the electrical characteristics of transistors, leading to performance degradation or complete failure. Lattice defects can disrupt the flow of current and cause device malfunctions. SEUs occur when a single radiation particle strikes a sensitive area of a microchip, flipping a bit in memory or causing a temporary logic error.

To achieve kiirgusvastupidavus, several techniques are employed during the design and manufacturing of electronic components. These include using specific semiconductor materials and fabrication processes that are inherently more resistant to radiation damage, such as silicon-on-insulator (SOI) technology. Circuit design techniques also play a role, such as redundancy, error detection and correction codes, and careful layout to minimize sensitive areas. Shielding can also be used to physically block radiation from reaching the sensitive components. The level of kiirgusvastupidavus required depends on the anticipated radiation dose and the criticality of the application.