Xsugárdiffrakció

Xsugárdiffrakció, also known as X-ray diffraction (XRD), is a powerful analytical technique used for determining the atomic and molecular structure of a crystal. It relies on the principle that when X-rays strike a crystalline material, they are scattered in specific directions due to the ordered arrangement of atoms within the crystal lattice. This scattering pattern is unique to each crystal structure, much like a fingerprint.

The process involves directing a beam of monochromatic X-rays at a powdered or single-crystal sample. The X-rays interact with the electrons of the atoms in the crystal, causing them to scatter. Constructive interference of these scattered X-rays occurs at specific angles, leading to the detection of diffraction peaks. These peaks are recorded on a detector, forming a diffraction pattern.

Analysis of this diffraction pattern, specifically the positions and intensities of the peaks, allows scientists to deduce information about the sample's crystalline phase, lattice parameters, and even the orientation of crystallites. This makes XRD indispensable in various fields, including materials science, chemistry, geology, and pharmaceutical research. It is used for identifying unknown compounds, determining the purity of materials, studying solid-state reactions, and characterizing thin films. The technique is non-destructive, meaning the sample is generally preserved after analysis.