Strukturlichtbasierte

Strukturlichtbasierte, also known as structured light-based, refers to a class of optical measurement techniques that use patterns of light to capture three-dimensional information about surfaces. These techniques are widely employed in various fields, including computer vision, robotics, and metrology. The basic principle behind strukturlichtbasierte methods involves projecting a known pattern of light onto a surface and then analyzing the deformation of this pattern as it interacts with the surface. This deformation provides information about the surface's geometry, such as its shape, texture, and depth.

One of the most common strukturlichtbasierte techniques is structured light 3D scanning. In this method, a projector casts a grid or stripe pattern onto the object of interest. A camera captures the distorted pattern from different angles, and by comparing the captured images with the original pattern, the system can calculate the three-dimensional coordinates of the object's surface. This process is repeated for multiple views to create a comprehensive 3D model.

Another application of strukturlichtbasierte methods is in optical metrology, where these techniques are used to measure the surface quality of optical components. By projecting a known pattern onto the surface of a lens or mirror and analyzing the resulting interference pattern, engineers can assess the surface's flatness, roughness, and other optical properties.

Strukturlichtbasierte methods offer several advantages over traditional measurement techniques. They are non-contact, which means they do not require physical contact with the object being measured. This makes them suitable for delicate or fragile objects. Additionally, these methods can capture high-resolution data quickly, making them ideal for dynamic or moving objects. However, they also have limitations, such as sensitivity to ambient light and the need for precise calibration to ensure accurate measurements.