Röntgenfluoreszenzspektroskopie

Röntgenfluoreszenz, often abbreviated as XRF, is an analytical technique used for elemental analysis and chemical characterization of materials. When a sample is bombarded with high-energy X-rays, the atoms within the sample absorb this energy. This absorption excites the inner-shell electrons of the atoms. As these excited electrons return to their lower energy ground states, they release energy in the form of secondary X-rays. These emitted X-rays are characteristic of the elements present in the sample, as each element has a unique set of energy levels. By measuring the energies and intensities of these emitted fluorescent X-rays, one can identify and quantify the elemental composition of the sample. XRF is a non-destructive technique, meaning the sample can be analyzed without being damaged. It is widely used across various fields, including geology, metallurgy, environmental monitoring, forensics, and industrial quality control, for applications such as identifying unknown substances, verifying material composition, and detecting trace elements. The sensitivity of XRF can vary depending on the element and the instrument, but it is generally capable of detecting elements from sodium upwards in the periodic table, down to parts per million (ppm) levels in many cases.