Röntgenfluoresentsanalüüs

Röntgenfluoresentsanalüüs, commonly known as X-ray fluorescence (XRF) spectroscopy, is a quantitative analytical technique used to determine the chemical composition of a material. It is based on the principle of X-ray fluorescence, where a sample is excited by an X-ray beam, causing the inner electrons of the atoms in the sample to be ejected. When these electrons return to their original energy level, they emit characteristic X-rays, which are then detected and analyzed.

The process begins with the excitation of the sample using an X-ray source, typically a tube or a synchrotron. The emitted X-rays interact with the sample, exciting inner shell electrons. When these electrons return to their ground state, they release excess energy in the form of characteristic X-rays. The energy of these X-rays is specific to the element that emitted them, allowing for the identification and quantification of the elements present in the sample.

XRF spectroscopy is widely used in various fields, including geology, metallurgy, environmental science, and materials research. It offers several advantages, such as non-destructive analysis, rapid results, and the ability to analyze a wide range of elements. However, it also has limitations, including the need for calibration standards and potential matrix effects that can affect the accuracy of the results.

The technique can be further divided into several methods, including wavelength-dispersive XRF (WD-XRF) and energy-dispersive XRF (ED-XRF). WD-XRF uses a crystal monochromator to separate the characteristic X-rays by wavelength, while ED-XRF employs a solid-state detector to measure the energy of the characteristic X-rays directly.

In summary, Röntgenfluoresentsanalüüs is a powerful analytical tool that provides valuable insights into the chemical composition of materials, making it an essential technique in many scientific and industrial applications.