Bundelhoeken
Bundelhoeken, also known as bundle angles or twist angles, refer to the relative orientation of layers in multi-layered materials. This concept is particularly relevant in the study of van der Waals heterostructures, which are formed by stacking different 2D materials like graphene, hexagonal boron nitride, or transition metal dichalcogenides. The way these layers are aligned with respect to each other significantly influences the electronic, optical, and magnetic properties of the resulting material.
The precise measurement and control of bundelhoeken are crucial for engineering novel materials with tailored functionalities.
Experimental techniques such as scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are commonly employed