substraateiwit

Substraateiwit, literally “substrate white” in Dutch, is a term used in materials science and industrial manufacturing to describe the perceived whiteness of a substrate surface under standard illumination. It encompasses the surface reflectance properties that make a substrate appear white in the visible spectrum, independent of any top coatings. The term is used especially in contexts where the base material and its surface treatment must contribute a high level of lightness for downstream processes such as printing, painting, or bonding.

Measurement and standards: Substraateiwit is typically quantified with a spectrophotometer or colorimeter, under a standard illuminant such as CIE D65 and viewing geometry. Whiteness metrics like the Whiteness Index (WI) or CIE L*a*b* coordinates may be reported, with WI or Yellowness index used to compare whiteness across substrates. The precise formula depends on the standard used and whether optical brighteners are present.

Factors: surface roughness, fillers, optical brighteners, inherent color of the base material, and contaminants affect substraateiwit. Finishing steps such as polishing, calendering, or coating can alter the perceived whiteness, sometimes more than the base color.

Applications: In paper, plastics, textiles, wood products, and coatings, substraateiwit serves as a baseline quality parameter, influencing printing fidelity, color reproduction, and bonding performance. It is distinct from the whiteness of a finished layer, which includes subsequent coatings.

Status: Substraateiwit is not a formal SI quantity or universally standardized property; rather it is a descriptive term used in industry and niche literature to discuss substrate whiteness properties.