stylusprofilometri

Stylus profilometry, or stylus profilometry, is a surface metrology technique that records the topography of a material by tracing its profile with a hard, sharp stylus. The stylus, usually diamond-tipped, makes physical contact with the surface while a vertical displacement is converted into an electrical signal. A scanning system moves the stylus or the sample in the x or y direction, producing a height profile h(x) along a measurement line.

The method yields high-resolution, direct measurements of surface height along the traced line. From the collected profile, standard roughness and waviness parameters can be calculated, such as average roughness (Ra), root mean square roughness (Rq), and peak-to-valley height (Rz). In practice, profilometers may provide real-time readouts and support filtering, baseline correction, and calibration against traceable standards. While most stylus profilometers produce two-dimensional profiles, some systems enable multi-pass measurements or staged scans to build a broader view of the surface topography.

Typical applications include characterizing metal, ceramic, plastic, and coated surfaces in manufacturing and research. The technique is valued for its robustness, relatively low cost, and ability to measure near-net surfaces with good vertical resolution. Limitations include potential damage to soft or fragile surfaces, tip wear that can affect accuracy, and slower data collection over large areas compared to non-contact methods. Stylus profilometry remains a foundational tool in quality control and materials research, with standards such as ISO and ASME guiding measurement procedures and parameter definitions.