röntgendiffraktionsbredd

Röntgendiffraktionsbredd, often referred to as the peak width in X-ray diffraction (XRD) analysis, quantifies the angular spread of a diffracted X-ray beam. This broadening is a crucial parameter that provides insights into the crystallographic properties of a material.

Several factors contribute to röntgendiffraktionsbredd. Primarily, it is influenced by crystallite size. Smaller crystallites lead to wider diffraction peaks due to the principles of Fourier analysis, as described by the Scherrer equation. For very small crystallites, the peak broadening becomes inversely proportional to the crystallite dimension.

Another significant contributor is lattice strain. Microscopic variations in the lattice spacing within the material, caused by defects such as dislocations, vacancies, or interstitial atoms, result in a distribution of d-spacings. This distribution leads to a broadening of the diffraction peaks. Lattice strain typically causes a different type of broadening compared to size effects.

Other factors can also contribute to peak broadening, though often to a lesser extent. These include instrumental broadening, inherent to the X-ray diffractometer itself, and particle shape effects. In some cases, overlapping diffraction peaks from different crystallographic planes can also appear as a single broad peak.

Analyzing röntgendiffraktionsbredd is a standard technique in materials science for determining crystallite size and lattice strain. By fitting the experimental peak profiles with theoretical models, researchers can extract these important microstructural parameters, aiding in the characterization and understanding of crystalline materials.