røntgenspektrometer

A røntgenspektrometer, or X‑ray spectrometer, is an instrument used to analyze the composition of materials by measuring the energy spectrum of emitted X‑rays. When a material is bombarded with high‑energy particles or photons, its atoms become excited and emit characteristic X‑ray lines that are unique to each element. The spectrometer detects these photons and records their energies, enabling a quantitative determination of elemental concentrations in the sample.

The core components of a røntgenspektrometer include an X‑ray source, a sample chamber, a detector array (commonly silicon drift detectors or germanium detectors), and a processing unit that converts raw signals into a spectrum. Modern instruments also feature active shielding, cooling systems for the detectors, and software for peak identification and background correction. In addition to basic elemental analysis, advanced techniques such as micro‑analysis, mapping, and depth profiling are possible by combining the spectrometer with imaging systems or dual‑beam electron microscopes.

Applications span multiple fields. In materials science, it is used to characterize alloys, thin films, and composites. The environment sector employs it for monitoring soil, water, and air pollutants. Archaeology and cultural heritage studies benefit from non‑destructive analysis of pigments, ceramics, and metals. Medical diagnostics sometimes use X‑ray fluorescence for bone mineral density and trace element assessment. Because the method requires only a small, often non‑destroyable sample, it is valued for its versatility and speed.

Limitations include limited sensitivity for light elements below boron, potential matrix effects that complicate quantitative analysis, and the need for careful calibration. Ongoing developments focus on enhancing spatial resolution, reducing acquisition times, and improving detector efficiency to broaden the spectrometer’s usability in both laboratory and industrial settings.