röntgenfluoresenssispektroskopiassa

Röntgenfluoreszenzspektroskopie, also known as X-ray fluorescence spectroscopy (XRF), is a analytical technique used to determine the chemical composition of a material. It works by irradiating a sample with high-energy X-rays, typically from a tungsten or rhodium target tube. When the incident X-rays interact with the sample, several processes can occur: photoelectric effect, Compton scattering, and fluorescence.

In the photoelectric effect, the incident X-ray photon is absorbed by an inner-shell electron, causing it to be ejected. This creates a vacancy in the inner shell, which is then filled by an electron from a higher energy level, releasing energy in the form of a characteristic X-ray photon. This emitted photon is specific to the element and can be detected and analyzed.

Compton scattering involves the incident X-ray photon transferring part of its energy to an outer-shell electron, resulting in the photon being scattered at a different angle. This process is less likely than the photoelectric effect but can still contribute to the overall signal.

Fluorescence occurs when the sample is excited by the incident X-rays, causing it to emit visible or ultraviolet light. This light can then be analyzed to provide additional information about the sample's composition.

The emitted X-ray photons are detected by a spectrometer, which measures their energy and intensity. This data is then used to quantify the concentration of each element present in the sample. Röntgenfluoreszenzspektroskopie is widely used in various fields, including geology, metallurgy, environmental science, and forensics, due to its ability to provide rapid, non-destructive analysis of a wide range of materials.