Xröntgenspectroscopie

Xröntgenspektroskopie is a powerful analytical technique used to determine the elemental composition and chemical state of a sample. It exploits the interaction of X-rays with matter. When X-rays of sufficient energy strike an atom, they can eject an inner-shell electron, creating a vacancy. This vacancy is then filled by an electron from an outer shell, and the energy difference is released as a characteristic X-ray photon. The energy of this emitted photon is unique to the element and its electronic environment.

There are several types of Xröntgenspektroskopie, including X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS). XRF detects the emitted fluorescent X-rays, providing information about elemental composition. XPS, on the other hand, measures the kinetic energy of photoelectrons ejected from the atom, offering insights into the chemical bonding and oxidation states of the elements present. Both methods are non-destructive and can analyze a wide range of materials, from solids and liquids to powders. Applications span various fields, including materials science, chemistry, environmental analysis, and art conservation, allowing for precise identification and quantification of elements.