STDF

STDF, or the Semiconductor Test Data Format, is a standard file format used in the semiconductor industry for storing test results from integrated circuits. It was developed by Teradyne, a major manufacturer of semiconductor test equipment, but has become a widely adopted industry standard. The primary purpose of STDF is to provide a consistent and structured way to record parametric data, yield information, and other test-related details generated during the manufacturing and testing of chips.

The STDF format is designed to be compact and efficient, allowing for the storage of large volumes of test data. It is organized into a series of records, each containing specific types of information. These records can include details about the test program, lot information, wafer information, site information, binning results, and individual test measurements. This structured approach facilitates data analysis, yield management, and failure diagnostics.

By using a standardized format, semiconductor manufacturers can easily share test data between different pieces of equipment, software applications, and even between different companies. This interoperability is crucial for optimizing production processes, identifying manufacturing defects, and improving product quality. Various software tools and utilities are available to read, write, and analyze STDF files, making it a cornerstone of semiconductor data management.