Röntgenspektroskopia

Röntgenspektroskopia, known in English as X-ray spectroscopy, is a technique used to study the elemental composition and chemical state of a material by analyzing its interaction with X-rays. When X-rays strike a sample, they can excite electrons within the atoms. As these excited electrons return to their lower energy states, they emit X-rays at specific energies, creating a unique spectral fingerprint for each element present. This emitted radiation is then detected and analyzed to identify the elements and their concentrations.

There are several variations of röntgenspektroskopia, including X-ray fluorescence (XRF) spectroscopy and X-ray photoelectron spectroscopy (XPS). XRF is a non-destructive technique commonly used for elemental analysis of solids, liquids, and powders. It is widely applied in fields such as geology, materials science, environmental monitoring, and art conservation. XPS, on the other hand, is a surface-sensitive technique that provides information about the chemical bonding and oxidation states of elements within the top few nanometers of a material. This makes it invaluable for studying surface chemistry, catalysis, and semiconductor properties. The analysis of the emitted or absorbed X-ray spectra allows for both qualitative identification of elements and quantitative determination of their abundance within the sample.