Peakforce

Peakforce is a term used in materials science and nanotechnology to describe a specific operational mode in atomic force microscopy (AFM). In peakforce tapping, the AFM tip is oscillated and brought into contact with the sample surface at the apex of each oscillation cycle. This intermittent contact mode allows for precise control and measurement of forces between the tip and the sample. The instrument measures the peak force exerted during each tap.

This technique offers several advantages over traditional tapping mode AFM. It provides a high degree of force sensitivity, allowing for the detection of subtle changes in surface properties. Furthermore, peakforce tapping can achieve significantly higher resolution, enabling the imaging of nanoscale features with remarkable clarity. The force applied during each tap is very low, which minimizes potential damage to delicate samples. This makes it suitable for imaging soft materials, biological samples, and other fragile specimens.

Peakforce AFM is widely employed in various research fields. It is used for characterizing the topography and mechanical properties of materials, such as polymers, composites, and thin films. In the life sciences, it aids in the study of cellular structures, biomolecules, and their interactions. The ability to precisely control and measure forces at the nanoscale also makes peakforce tapping valuable for applications in areas like semiconductor fabrication and nanotechnology research. The data generated can provide insights into adhesion, friction, and elasticity of surfaces.