Diffraktometry

Diffraktometry is a scientific technique used to probe the atomic and molecular structure of a material. It relies on the principle of diffraction, where waves, such as X-rays, neutrons, or electrons, are scattered by the regularly spaced atoms or molecules within a sample. The scattered waves interfere with each other, creating a diffraction pattern that is unique to the material's structure. By analyzing the angles and intensities of these diffracted waves, scientists can deduce information about the arrangement of atoms, bond lengths, crystal lattice parameters, and even the presence of different phases within the material.

The process typically involves directing a beam of radiation at a sample and measuring the intensity of the scattered radiation at various angles. The resulting data is plotted as a diffractogram, which shows peaks corresponding to specific diffraction events. The positions of these peaks are related to the spacing between atomic planes according to Bragg's Law, while the heights of the peaks provide information about the types of atoms present and their arrangement. Diffraktometry is a versatile tool with applications in fields such as materials science, chemistry, physics, and biology, used for characterizing crystalline solids, powders, thin films, and even liquids.